Title :
A uniformity criterion and algorithm for data clustering
Author :
Shetty, Sanketh ; Ahuja, Narendra
Author_Institution :
Beckman Inst. for Adv. Sci. & Technol., Univ. of Illinois, Urbana-Champaign, IL
Abstract :
We propose a novel multivariate uniformity criterion for testing uniformity of point density in an arbitrary dimensional point pattern. An unsupervised, nonparametric data clustering algorithm, using this criterion, is also presented. The algorithm relies on a relatively general notion of cluster so that it is applicable to clusters of relatively unrestricted shapes, densities and sizes. We define a cluster as a set of contiguous interior points surrounded by border points. We use our uniformity test to differentiate between interior and border points. We group interior points to form cluster cores, and then identify cluster borders as formed by the border points neighboring the cluster cores. The algorithm is effective in resolving clusters of different shapes, sizes and densities. It is relatively insensitive to outliers. We present results for experiments performed on artificial and real data sets.
Keywords :
pattern clustering; statistical distributions; arbitrary dimensional point pattern; contiguous interior point; multivariate uniformity criterion; unsupervised nonparametric data clustering algorithm; Algorithm design and analysis; Clustering algorithms; Data analysis; Image segmentation; Multidimensional systems; Performance analysis; Pixel; Shape; Testing; Voting;
Conference_Titel :
Pattern Recognition, 2008. ICPR 2008. 19th International Conference on
Conference_Location :
Tampa, FL
Print_ISBN :
978-1-4244-2174-9
Electronic_ISBN :
1051-4651
DOI :
10.1109/ICPR.2008.4761239