DocumentCode
2478019
Title
Hierarchical Large Margin Nearest Neighbor Classification
Author
Chen, Qiaona ; Sun, Shiliang
Author_Institution
Dept. of Comput. Sci. & Technol., East China Normal Univ., Shanghai, China
fYear
2010
fDate
23-26 Aug. 2010
Firstpage
906
Lastpage
909
Abstract
Distance metric learning has exhibited its great power to enhance performance in metric related pattern recognition tasks. The recent large margin nearest neighbor classification (LMNN) improves the performance of k-nearest neighbor classification by learning a global distance metric. However, it does not consider the locality of data distributions, which is crucial in determining a proper metric. In this paper, we propose a novel local distance metric learning method called hierarchical LMNN (HLMNN) which first builds a hierarchical structure by grouping data points according to the overlapping ratios defined by us and then learns distance metrics sequentially. Experimental results on real-world data sets including comparisons with the traditional k-nearest neighbor and the state-of-the-art LMNN show the effectiveness of the proposed HLMNN.
Keywords
learning (artificial intelligence); pattern classification; distance metric learning; hierarchical large margin nearest neighbor classification; overlapping ratios; pattern recognition tasks; Euclidean distance; Glass; Learning systems; Nearest neighbor searches; Pattern recognition; Sun; distance metric learning; global metric; hierarchical structure; k-nearest neighbor; local metric;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location
Istanbul
ISSN
1051-4651
Print_ISBN
978-1-4244-7542-1
Type
conf
DOI
10.1109/ICPR.2010.228
Filename
5595821
Link To Document