• DocumentCode
    2478136
  • Title

    Non-intrusive load monitoring based on switching voltage transients and wavelet transforms

  • Author

    Duarte, Cesar ; Delmar, Paul ; Goossen, Keith W. ; Barner, Kenneth ; Gomez-Luna, Eduardo

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of Delaware, Newark, DE, USA
  • fYear
    2012
  • fDate
    8-9 Oct. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Continuous Wavelet Transform (CWT) analysis to find feature vectors for switching voltage transients for Non-Intrusive Load Monitoring (NILM) is presented and discussed, and compared with the previously used short time Fourier transform (STFT). The feature vectors computed from both CWT and STFT were used to train Support Vector Machines (SVMs) that identify the connection or disconnection of appliances for a NILM system. Experimental results show that the CWT analysis based on the complex Morlet wavelet improves classification accuracy as compared to the analysis based on STFT. More importantly, a 20× reduction of the vector size requirement is shown, thus greatly lowering computational requirements. It can be expected that commercial transient-based NILM will be based upon the CWT methods shown here.
  • Keywords
    Fourier transforms; domestic appliances; power engineering computing; power system measurement; support vector machines; wavelet transforms; CWT analysis; NILM system; STFT; SVM; classification accuracy; commercial transient-based NILM; complex Morlet wavelet; continuous wavelet transform analysis; feature vectors; household appliances; nonintrusive load monitoring; short-time Fourier transform; support vector machines; switching voltage transients; wavelet transforms; Continuous wavelet transforms; Home appliances; Support vector machine classification; Transient analysis; Nonintrusive load monitoring; Wavelet transform; complex Morlet wavelet; short time Fourier transform; support vector machine; switching transients; transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Future of Instrumentation International Workshop (FIIW), 2012
  • Conference_Location
    Gatlinburg, TN
  • Print_ISBN
    978-1-4673-2483-0
  • Type

    conf

  • DOI
    10.1109/FIIW.2012.6378333
  • Filename
    6378333