DocumentCode
2478151
Title
P2I-8 Modelling the Operating Frequency of Thin Film Piezoelectric Transducers
Author
Hood, John Paul ; Elgoyhen, Jocelyn ; Hutson, David ; Kirk, Katherine J.
Author_Institution
Univ. of Paisley Paisley, Paisley
fYear
2007
fDate
28-31 Oct. 2007
Firstpage
1705
Lastpage
1708
Abstract
We have investigated the operating frequency of aluminium nitride thin film transducers up to 350 MHz. A sample consisting of 44 different sized devices (0.25-9 mm ) was fabricated. Each device consisted of a gold electrode (90 nm thick), aluminium nitride active layer (4 mum thick) on a glass substrate (1mm thick). Time domain and frequency domain results in pulse echo mode were also recorded from each device. It was found that using a JSR Ultrasonics DPR500 pulser receiver with 500MHz bandwidth, echoes could be received with frequency content between 60 MHz and 450 MHz. However this result was limited by the bandwidth of the digital scope being 350MHz. Using the DPR300 model from the same company with 50MHz bandwidth echoes were received between 5MHz and 65MHz. These results illustrated the effect of the harmonics in the driving pulse on the operating frequency of the thin film transducer. This investigation confirmed the results of a nondestructive testing experiment in which A-Scans were successfully obtained from a 65 mm thick ferritic steel steam pipe at a frequency of 5MHz using a thin film transducer.
Keywords
Curie temperature; III-V semiconductors; SPICE; aluminium compounds; nondestructive testing; piezoelectric thin films; piezoelectric transducers; semiconductor device models; ultrasonic transducers; 2BE, SPICE;; AlN; Curie temperature;; JSR ultrasonics DPR500 pulser receiver; aluminium nitride active layer; aluminium nitride thin film transducer; ferritic steel steam pipe; frequency 5 MHz to 65 MHz; frequency 60 MHz to 450 MHz; frequency domain analysis; glass substrate; gold electrode; nondestructive testing; operating frequency model; pulse echo mode; size 0.25 mm to 9 mm; size 4 mum; size 65 mm; size 90 nm; thin film piezoelectric transducer; time domain analysis; Aluminum; Bandwidth; Electrodes; Frequency; Glass; Gold; Piezoelectric films; Piezoelectric transducers; Substrates; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2007. IEEE
Conference_Location
New York, NY
ISSN
1051-0117
Print_ISBN
978-1-4244-1384-3
Electronic_ISBN
1051-0117
Type
conf
DOI
10.1109/ULTSYM.2007.429
Filename
4410002
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