DocumentCode
2478367
Title
P3B-4 Coded Excitation and Nonlinear Pulse Compression in Pulse-Inversion Fundamental Imaging
Author
Shen, Che-Chou ; Cheng, Yun-Chien ; Li, Pai-Chi
Author_Institution
Nat. Taiwan Univ. of Sci. & Technol., Taipei
fYear
2007
fDate
28-31 Oct. 2007
Firstpage
1744
Lastpage
1747
Abstract
Coded excitation can be applied in pulse-inversion- fundamental (PIF) imaging to enhance the signal-to-noise ratio with minimal destruction of the microbubbles. Nevertheless, nonlinear responses from microbubbles may cause difficulties in pulse compression and result in severe range side-lobe artifacts. The efficacy of pulse compression was evaluated by investigating several factors relevant to PIF generation using both in-vitro experiments and simulations. Results indicate that, when nonlinear responses from contrast agents are enhanced by using a higher acoustic pressure or when more microbubbles are near the resonance size of the transmit frequency, higher range side- lobes are produced after compression. On the other hand, the contrast-to-tissue ratio (CTR) in PIF imaging still increases with acoustic pressure and the nonlinear resonance of microbubbles because of elevated main-lobe level. However, the use of coded excitation is not beneficial in PIF contrast detection because the CTR after compression is consistently lower than that before compression due to obvious side-lobe artifacts.
Keywords
acoustic resonance; acoustic signal processing; biomedical ultrasonics; pulse compression; ultrasonic imaging; acoustic pressure; coded excitation; contrast agents; contrast-to-tissue ratio; microbubble destruction; nonlinear microbubble resonance; nonlinear pulse compression; pulse-inversion fundamental imaging; side-lobe artifacts; signal-to-noise ratio; Acoustic imaging; Acoustic signal detection; Brain modeling; Frequency; In vitro; Nonlinear acoustics; Pulse compression methods; Pulse generation; Resonance; Signal to noise ratio;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2007. IEEE
Conference_Location
New York, NY
ISSN
1051-0117
Print_ISBN
978-1-4244-1384-3
Electronic_ISBN
1051-0117
Type
conf
DOI
10.1109/ULTSYM.2007.439
Filename
4410012
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