• DocumentCode
    2478484
  • Title

    Event driven analog modeling for the verification of PLL frequency synthesizers

  • Author

    Wang, Yifan ; Van-Meersbergen, Christoph ; Groh, Hans-Werner ; Heinen, Stefan

  • Author_Institution
    Analog Circuits, RWTH Aachen, Aachen, Germany
  • fYear
    2009
  • fDate
    17-18 Sept. 2009
  • Firstpage
    25
  • Lastpage
    30
  • Abstract
    The focus of this work is to provide a efficient modeling approach for the functional verification of complex analog frequency synthesizers. The event driven analog modeling approach uses the double precision data type wreal (supported by VerilogAMS), that enables analog accuracy in the digital simulation domain. It is therefore possible to separate high frequency signal paths in the frequency synthesizers from the analog domain, in order to archive higher simulation efficiency for fast verification purposes. The modeling approach and an investigation of the necessary accuracy requirements for the verification including phase noise performances of the analog frequency synthesizers is presented. The proposed approach is demonstrated on baseof a sub micron CMOS Fractional-N frequency synthesizer and compared with different traditional modeling approaches, like phase model and pure digital model. The paper concludes with a proposal of a verification approach for RF mixed signal systems.
  • Keywords
    CMOS analogue integrated circuits; analogue integrated circuits; frequency synthesizers; hardware description languages; phase locked loops; PLL frequency synthesizers; RF mixed signal systems; VerilogAMS; complex analog frequency synthesizers; digital simulation domain; double precision data type wreal; event driven analog modeling; sub micron CMOS fractional-N frequency synthesizer; Analog circuits; Discrete event simulation; Frequency synthesizers; Hardware design languages; Performance analysis; Phase locked loops; Phase noise; Radio frequency; Semiconductor device modeling; Testing; Modeling; VerilogAMS; accuracy requirements; phase noise; verification; wreal;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Behavioral Modeling and Simulation Workshop, 2009. BMAS 2009. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-5358-0
  • Type

    conf

  • DOI
    10.1109/BMAS.2009.5338892
  • Filename
    5338892