• DocumentCode
    2478486
  • Title

    Large Margin Discriminant Hashing for Fast k-Nearest Neighbor Classification

  • Author

    Shibata, Tomoyuki ; Kubota, Susumu ; Ito, Satoshi

  • Author_Institution
    Corp. R&D Center, Toshiba Corp., Kawasaki, Japan
  • fYear
    2010
  • fDate
    23-26 Aug. 2010
  • Firstpage
    1015
  • Lastpage
    1018
  • Abstract
    Since the k-nearest neighbor (k-NN) classification is computationally demanding in terms of time and memory, approximate nearest neighbor (ANN) algorithms that utilize dimensionality reduction and hashing are gathering interest. Dimensionality reduction saves memory usage for storing training patterns and hashing techniques significantly reduce the computation required for distance calculation. Several ANN methods have been proposed which make k-NN classification applicable to those tasks that have a large number of training patterns with very high-dimensional feature. Though conventional ANN methods try to approximate Euclidean distance calculation in the original high-dimensional feature space with much lower-dimensional subspace, the Euclidean distance in the original feature space is not necessarily optimal for classification. According to the recent studies, metric learning is effective to improve accuracy of the k-NN classification. In this paper, Large Margin Discriminative Hashing (LMDH) method, which projects input patterns into low dimensional subspace with the optimized metric for the k-NN classification, is proposed.
  • Keywords
    learning (artificial intelligence); pattern classification; storage management; ANN algorithms; Euclidean distance calculation; LMDH method; approximate nearest neighbor algorithms; dimensionality reduction; fast k-nearest neighbor classification; hashing techniques; high-dimensional feature space; k-NN classification; large margin discriminant hashing; lower-dimensional subspace; memory usage; metric learning; training patterns storage; Artificial neural networks; Classification algorithms; Error analysis; Face; Measurement; Nearest neighbor searches; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2010 20th International Conference on
  • Conference_Location
    Istanbul
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4244-7542-1
  • Type

    conf

  • DOI
    10.1109/ICPR.2010.254
  • Filename
    5595844