DocumentCode
2478486
Title
Large Margin Discriminant Hashing for Fast k-Nearest Neighbor Classification
Author
Shibata, Tomoyuki ; Kubota, Susumu ; Ito, Satoshi
Author_Institution
Corp. R&D Center, Toshiba Corp., Kawasaki, Japan
fYear
2010
fDate
23-26 Aug. 2010
Firstpage
1015
Lastpage
1018
Abstract
Since the k-nearest neighbor (k-NN) classification is computationally demanding in terms of time and memory, approximate nearest neighbor (ANN) algorithms that utilize dimensionality reduction and hashing are gathering interest. Dimensionality reduction saves memory usage for storing training patterns and hashing techniques significantly reduce the computation required for distance calculation. Several ANN methods have been proposed which make k-NN classification applicable to those tasks that have a large number of training patterns with very high-dimensional feature. Though conventional ANN methods try to approximate Euclidean distance calculation in the original high-dimensional feature space with much lower-dimensional subspace, the Euclidean distance in the original feature space is not necessarily optimal for classification. According to the recent studies, metric learning is effective to improve accuracy of the k-NN classification. In this paper, Large Margin Discriminative Hashing (LMDH) method, which projects input patterns into low dimensional subspace with the optimized metric for the k-NN classification, is proposed.
Keywords
learning (artificial intelligence); pattern classification; storage management; ANN algorithms; Euclidean distance calculation; LMDH method; approximate nearest neighbor algorithms; dimensionality reduction; fast k-nearest neighbor classification; hashing techniques; high-dimensional feature space; k-NN classification; large margin discriminant hashing; lower-dimensional subspace; memory usage; metric learning; training patterns storage; Artificial neural networks; Classification algorithms; Error analysis; Face; Measurement; Nearest neighbor searches; Training;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location
Istanbul
ISSN
1051-4651
Print_ISBN
978-1-4244-7542-1
Type
conf
DOI
10.1109/ICPR.2010.254
Filename
5595844
Link To Document