DocumentCode :
2478486
Title :
Large Margin Discriminant Hashing for Fast k-Nearest Neighbor Classification
Author :
Shibata, Tomoyuki ; Kubota, Susumu ; Ito, Satoshi
Author_Institution :
Corp. R&D Center, Toshiba Corp., Kawasaki, Japan
fYear :
2010
fDate :
23-26 Aug. 2010
Firstpage :
1015
Lastpage :
1018
Abstract :
Since the k-nearest neighbor (k-NN) classification is computationally demanding in terms of time and memory, approximate nearest neighbor (ANN) algorithms that utilize dimensionality reduction and hashing are gathering interest. Dimensionality reduction saves memory usage for storing training patterns and hashing techniques significantly reduce the computation required for distance calculation. Several ANN methods have been proposed which make k-NN classification applicable to those tasks that have a large number of training patterns with very high-dimensional feature. Though conventional ANN methods try to approximate Euclidean distance calculation in the original high-dimensional feature space with much lower-dimensional subspace, the Euclidean distance in the original feature space is not necessarily optimal for classification. According to the recent studies, metric learning is effective to improve accuracy of the k-NN classification. In this paper, Large Margin Discriminative Hashing (LMDH) method, which projects input patterns into low dimensional subspace with the optimized metric for the k-NN classification, is proposed.
Keywords :
learning (artificial intelligence); pattern classification; storage management; ANN algorithms; Euclidean distance calculation; LMDH method; approximate nearest neighbor algorithms; dimensionality reduction; fast k-nearest neighbor classification; hashing techniques; high-dimensional feature space; k-NN classification; large margin discriminant hashing; lower-dimensional subspace; memory usage; metric learning; training patterns storage; Artificial neural networks; Classification algorithms; Error analysis; Face; Measurement; Nearest neighbor searches; Training;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location :
Istanbul
ISSN :
1051-4651
Print_ISBN :
978-1-4244-7542-1
Type :
conf
DOI :
10.1109/ICPR.2010.254
Filename :
5595844
Link To Document :
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