• DocumentCode
    247865
  • Title

    Mystery behind similarity measures mse and SSIM

  • Author

    Palubinskas, G.

  • Author_Institution
    Remote Sensing Technol. Inst., German Aerosp. Center DLR, Wessling, Germany
  • fYear
    2014
  • fDate
    27-30 Oct. 2014
  • Firstpage
    575
  • Lastpage
    579
  • Abstract
    Similarity or distance measures play an important role in various pattern recognition applications such as classification, clustering, change detection, information retrieval, energy minimization and optimization problems. We shall analyze theoretically the two most popular quality measures MSE and SSIM used in image processing by showing their origin, similarities/differences and advantages/drawbacks. Both measures depend on the same parameters: sample means, standard deviations and correlation coefficient. It is shown that SSIM originates from two Dice measures and thus inherit their main drawback - dependence on the absolute mean and standard deviation values. Similarly, MSE depends on the absolute standard deviation values. A new similarity measure Composite quality index based on Means, Standard deviations and Correlation coefficient (CMSC) is proposed inheriting advantages of the both measures but at the same time avoiding their drawbacks.
  • Keywords
    image processing; mean square error methods; CMSC; MSE; SSIM; absolute standard deviation values; change detection; classification; clustering; correlation coefficient; dice measures; distance measures; energy minimization; image processing; information retrieval; optimization problems; pattern recognition applications; similarity measure composite quality index; similarity measures; standard deviations; Correlation coefficient; Image quality; Indexes; Measurement uncertainty; Standards; Time measurement; Dice; Euclidian; Similarity; composite; correlation coefficient; distance; image; quality index;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2014 IEEE International Conference on
  • Conference_Location
    Paris
  • Type

    conf

  • DOI
    10.1109/ICIP.2014.7025115
  • Filename
    7025115