DocumentCode :
2478688
Title :
On Defect N-Extendable Bipartite Graph and Its Application
Author :
Wen, Xuelian ; Yang, Zihui
Author_Institution :
Sch. of Econ. & Manage., South China Normal Univ., Guangzhou, China
fYear :
2010
fDate :
22-23 May 2010
Firstpage :
1
Lastpage :
4
Abstract :
A near perfect matching is a matching covering all but one vertex in a graph. Let G be a connected graph with 2n + 3 vertices at least. If any n independent edges in G are contained in a near perfect matching, then G is said to be defect n-extendable. Let G be a defect n-extendable bipartite graph with connectivity not less than two and M be a near perfect matching of G. In this paper, we first characterize G using M-alternating paths, which can be developed into an effective algorithm to determine whether a bipartite graph with connectivity not less than two is defect n-extendable. This problem finds application in the circuit design of allocating jobs to processors when some jobs require specified machines to process. We also study the number of disjoint M-alternating paths between two subsets and between a vertex and a subset of G respectively.
Keywords :
graph theory; M-alternating paths; defect N-extendable bipartite graph; near perfect matching; Bipartite graph; Circuit synthesis; Educational institutions; Joining processes; Robustness; Sun; Terminology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Systems and Applications (ISA), 2010 2nd International Workshop on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-5872-1
Electronic_ISBN :
978-1-4244-5874-5
Type :
conf
DOI :
10.1109/IWISA.2010.5473302
Filename :
5473302
Link To Document :
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