• DocumentCode
    2478688
  • Title

    On Defect N-Extendable Bipartite Graph and Its Application

  • Author

    Wen, Xuelian ; Yang, Zihui

  • Author_Institution
    Sch. of Econ. & Manage., South China Normal Univ., Guangzhou, China
  • fYear
    2010
  • fDate
    22-23 May 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A near perfect matching is a matching covering all but one vertex in a graph. Let G be a connected graph with 2n + 3 vertices at least. If any n independent edges in G are contained in a near perfect matching, then G is said to be defect n-extendable. Let G be a defect n-extendable bipartite graph with connectivity not less than two and M be a near perfect matching of G. In this paper, we first characterize G using M-alternating paths, which can be developed into an effective algorithm to determine whether a bipartite graph with connectivity not less than two is defect n-extendable. This problem finds application in the circuit design of allocating jobs to processors when some jobs require specified machines to process. We also study the number of disjoint M-alternating paths between two subsets and between a vertex and a subset of G respectively.
  • Keywords
    graph theory; M-alternating paths; defect N-extendable bipartite graph; near perfect matching; Bipartite graph; Circuit synthesis; Educational institutions; Joining processes; Robustness; Sun; Terminology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Systems and Applications (ISA), 2010 2nd International Workshop on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-5872-1
  • Electronic_ISBN
    978-1-4244-5874-5
  • Type

    conf

  • DOI
    10.1109/IWISA.2010.5473302
  • Filename
    5473302