DocumentCode
2478699
Title
Evaluation of chromatic dispersion in erbium-doped fibers
Author
Gasper, D.S. ; Wysocki, P.F. ; Reed, W.A. ; Vengsarkar, A.M.
Author_Institution
AT&T Bell Labs., Murray Hill, NJ, USA
fYear
1993
fDate
15-18 Nov 1993
Firstpage
167
Lastpage
168
Abstract
Transoceanic fiber optic systems that use erbium doped fiber amplifiers(EDFAs) require careful tailoring of chromatic dispersion along the length of the span. One of the parameters of interest to system designers is the additional chromatic dispersion introduced by the erbium ions in the EDFA. The effect of resonant chromatic dispersion due to erbium is also evident in the performance of short length fiber devices such as soliton lasers. Several methods have been used in the past to measure erbium-induced chromatic dispersion. Specifically, Fourier transform spectroscopy and the use of complex atomic susceptibility have been successfully demonstrated. In this paper, we evaluate the complex atomic susceptibility of these fibers with different dopant levels and derive the total dispersion (waveguide and material) of these fibers as a function of wavelength in the 1550 nm range
Keywords
Fourier transform spectroscopy; erbium; fibre lasers; infrared spectroscopy; optical cables; optical fibre communication; optical fibre dispersion; optical fibre testing; optical susceptibility; submarine cables; 1550 nm; 1550 nm range; EDFAs; Fourier transform spectroscopy; additional chromatic dispersion; chromatic dispersion; complex atomic susceptibility; dopant levels; erbium doped fiber amplifiers; erbium ions; erbium-doped fibers; erbium-induced chromatic dispersion; resonant chromatic dispersion; short length fiber devices; soliton lasers; system designers; total dispersion; transoceanic fiber optic systems; Atomic beams; Atomic measurements; Chromatic dispersion; Doped fiber amplifiers; Erbium; Erbium-doped fiber amplifier; Optical fiber amplifiers; Optical fiber devices; Optical fibers; Semiconductor optical amplifiers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society Annual Meeting, 1993. LEOS '93 Conference Proceedings. IEEE
Conference_Location
San Jose, CA
Print_ISBN
0-7803-1263-5
Type
conf
DOI
10.1109/LEOS.1993.379087
Filename
379087
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