DocumentCode :
2479373
Title :
“The effect of carrier lifetime profile on turn-off time and turn-off losses”
Author :
Temple, V.A.K. ; Holroyd, F.W. ; Adler, M.S. ; Gray, P.V.
Author_Institution :
General Electric, Corporate Research & Development, Schenectady, New York 12345, USA
fYear :
1980
fDate :
16-20 June 1980
Firstpage :
155
Lastpage :
163
Abstract :
The trade-off between forward voltage drop and device turn-off time can be significantly altered by the proper location of a narrow region of lower lifetime oriented perpendicular to the current flow. The proposed structure is discussed and calculations presented to illustrate this claim. Difference in thyristor turn-off and diode turn-off in an inductive circuit and when driven by a perfect voltage source are investigated. A portion of this investigation was reported at the 1979 PESC.
Keywords :
Anodes; Computers; Doping; Gold; Junctions; Switches; Thyristors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics Specialists Conference, 1980. PESC. IEEE
Conference_Location :
Atlanta, Georgia, USA
ISSN :
0275-9306
Type :
conf
DOI :
10.1109/PESC.1980.7089443
Filename :
7089443
Link To Document :
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