Title :
“The effect of carrier lifetime profile on turn-off time and turn-off losses”
Author :
Temple, V.A.K. ; Holroyd, F.W. ; Adler, M.S. ; Gray, P.V.
Author_Institution :
General Electric, Corporate Research & Development, Schenectady, New York 12345, USA
Abstract :
The trade-off between forward voltage drop and device turn-off time can be significantly altered by the proper location of a narrow region of lower lifetime oriented perpendicular to the current flow. The proposed structure is discussed and calculations presented to illustrate this claim. Difference in thyristor turn-off and diode turn-off in an inductive circuit and when driven by a perfect voltage source are investigated. A portion of this investigation was reported at the 1979 PESC.
Keywords :
Anodes; Computers; Doping; Gold; Junctions; Switches; Thyristors;
Conference_Titel :
Power Electronics Specialists Conference, 1980. PESC. IEEE
Conference_Location :
Atlanta, Georgia, USA
DOI :
10.1109/PESC.1980.7089443