• DocumentCode
    2479758
  • Title

    EEG analysis for estimation of duration and inter-event intervals of seizure-like events recorded in vivo from mice

  • Author

    Colic, Sinisa ; Wither, Rob ; Eubanks, James H. ; Zhang, Liang ; Bardakjian, Berj L.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
  • fYear
    2011
  • fDate
    Aug. 30 2011-Sept. 3 2011
  • Firstpage
    2570
  • Lastpage
    2573
  • Abstract
    Rett syndrome is a neurodevelopmental disorder of the brain that affects females more often than males. Its cause is linked to the mutations within the gene encoding methyl CpG-binding protein 2 (MeCP2). Presently, there is little information regarding how the loss of MeCP2 affects brain activity. It has been documented that during awake but immobile state, the MeCP2 deficient mice exhibit spontaneous, rhythmic electroencephalogram (EEG) seizure-like events (SLEs) in the range of 6-9 Hz. In this study, we analyze the cortical EEG activity in female MeCP2-deficient mice over 24 hour recordings. Characterizing the SLE and inter-SLE durations by fitting to a gamma distribution we show similarity to previous in vivo epilepsy studies. These results suggest that the SLE and inter-SLE dynamics differ. More precisely, the SLE terminations appear to be a result of time-dependent mechanisms, whereas the inter-SLEs are a result of a random process.
  • Keywords
    electroencephalography; medical disorders; proteins; EEG analysis; Rett syndrome; brain activity; gamma distribution; gene encoding MeCP2; methyl CpG-binding protein 2; mice; neurodevelopmental disorder; seizure like event duration estimation; seizure like event interevent interval; time 24 hour; Brain models; Educational institutions; Electroencephalography; Epilepsy; Mice; Animals; Automation; Electroencephalography; Female; Mice; Seizures;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
  • Conference_Location
    Boston, MA
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4121-1
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2011.6090710
  • Filename
    6090710