DocumentCode :
2479883
Title :
Distortion invariant optical pattern recognition
Author :
Gheen, Gregory
Author_Institution :
Lockheed Missiles & Space Co. Inc., Palo Alto, CA, USA
fYear :
1993
fDate :
15-18 Nov 1993
Firstpage :
51
Lastpage :
52
Abstract :
Pattern recognition involves assigning an unknown signal to a specific class. This is a difficult task because the set of signals associated with a class can vary widely in the Euclidean distance sense. For example, an image is effected by factors such as: perspective changes, lighting conditions, imaging environment (e.g. intervening clouds), and occlusions. All of these factors act in concert to generate a wide range of possible images for the same object. These variations are referred to as distortions. For simplicity, we will only discuss a two class pattern recognition problem, where a signal is classified as either target or clutter. The extension to multiclass problem is straight forward
Keywords :
clutter; image recognition; optical noise; Euclidean distance sense; clutter; distortion invariant optical pattern recognition; distortions; image; imaging environment; intervening clouds; lighting conditions; multiclass problem; occlusions; perspective changes; possible images; target; two class pattern recognition problem; unknown signal; Bayesian methods; Clouds; Euclidean distance; Missiles; Nearest neighbor searches; Optical distortion; Optical imaging; Optical sensors; Pattern recognition; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1993. LEOS '93 Conference Proceedings. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-1263-5
Type :
conf
DOI :
10.1109/LEOS.1993.379135
Filename :
379135
Link To Document :
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