Title :
Texture of Cr interlayer in double CoCrTa thin films
Author :
Feng, Y.C. ; Laughlin, D.E. ; Lambeth, D.N.
Author_Institution :
Carnegie Mellon University
Keywords :
Chromium; Transistors; X-ray diffraction;
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
DOI :
10.1109/INTMAG.1992.696663
