Title :
Utilizing Qs and Qk to model TE materials for predicting temperature dependence
Author :
Buist, Richard J.
Author_Institution :
TE Technol. Inc., Traverse City, MI, USA
Abstract :
The parameters, Qs and Qk, were first introduced by Tuomi (1962, 1964) from research contracted to The Franklin Institute. They were named Qs=quality with respect to Seebeck and Qk=quality with respect to Kappa (thermal conductivity) (Tuomi 1983). The present author has used these parameters extensively, plus specimen test data from a single test point, to forecast the thermoelectric (TE) parameter temperature dependence, thereby proving the key information needed to design and optimize TE devices whenever only a single test point is available
Keywords :
Seebeck effect; modelling; thermal conductivity; thermoelectric devices; Kappa quality; Seebeck quality; device design; device optimisation; single test point; temperature dependence; thermal conductivity; thermoelectric devices; thermoelectric parameters; Charge carrier processes; Conducting materials; Materials testing; Predictive models; Semiconductor materials; System testing; Tellurium; Temperature dependence; Thermal conductivity; Thermoelectricity;
Conference_Titel :
Thermoelectrics, 1998. Proceedings ICT 98. XVII International Conference on
Conference_Location :
Nagoya
Print_ISBN :
0-7803-4907-5
DOI :
10.1109/ICT.1998.740320
