Title :
A Calderón preconditioner for the EFIE operator without barycentric refinement of the mesh
Author :
Adrian, Simon B. ; Andriulli, Francesco P. ; Eibert, Thomas F.
Author_Institution :
Tech. Univ. Munchen, Munich, Germany
Abstract :
Among the techniques to solve the ill-conditioning of the electric field integral equation (EFIE), multiplicative approaches based on Calderón identities are peculiarly effective. They rely on the use of a dual basis, like the Buffa-Christiansen (BC) or Chen-Wilton (CW) basis functions, to stably discretize the Hdiv-1/2-Hcurl-1/2 duality. These dual basis functions, unfortunately, require a barycentric refinement of the mesh resulting in an increase of the memory consumption. This work presents a multiplicative preconditioner for the EFIE operator that, differently from other Calderón preconditioning approaches, does not require the barycentric refinement of the mesh. The new preconditioner is obtained by chaining two standard system matrices (discretized on the standard, non-refined, mesh) with a suitably designed Gram matrix and appropriately chosen pre- and post-smoothers. A theoretical analysis proves the effectiveness of the proposed preconditioner and numerical results from realistic application scenarios corroborate the presented theory.
Keywords :
electric field integral equations; electromagnetic wave scattering; matrix algebra; BC basis functions; Buffa-Christiansen basis functions; CW basis functions; Calderon identities; Calderon preconditioner; Chen-Wilton basis functions; EFIE ill-conditioning; EFIE operator; Gram matrix; dual-basis functions; electric field integral equation ill-conditioning; electromagnetic wave scattering problem; multiplicative approach; multiplicative preconditioner; post-smoother; pre-smoother; standard system matrix chain; theoretical analysis; Electric breakdown; Electromagnetic scattering; Integral equations; Laplace equations; Memory management; Standards; Surface waves;
Conference_Titel :
Antennas and Propagation Society International Symposium (APSURSI), 2014 IEEE
Conference_Location :
Memphis, TN
Print_ISBN :
978-1-4799-3538-3
DOI :
10.1109/APS.2014.6905417