Title :
Network Flow Modeling for Flexible Manufacturing Systems with Re-entrant Lines
Author :
Hindi, Haitham ; Ruml, Wheeler
Author_Institution :
Palo Alto Res. Center, CA
Abstract :
A relaxed version of the process planning problem for flexible manufacturing systems/cells (FMS/FMC) and processing networks, such as flexible flow shops and general job shops, is formulated using a simple extension of multicommodity network flow problems. Our multistage multicommodity network formulation allows for simultaneous routing and resource allocation and also captures the case of re-entrant lines (recirculation). It can be used to perform rapid, albeit crude, explorations of the combinatorial space of possible configurations and failure scenarios. The technique can also provide bounds on the limits of system performance (eg: throughput, link usage, bottlenecks, etc). This can be used to guide the design of robust FMS architectures with high degree of redundancy in machines and routes, as demonstrated in numerical examples. Being a relaxation to the full discrete problem, our method could potentially be used as an admissible heuristic for pruning Al-based planning methods. We demonstrate our approach on a realistic industrial problem
Keywords :
combinatorial mathematics; flexible manufacturing systems; flow shop scheduling; heuristic programming; job shop scheduling; planning (artificial intelligence); process planning; redundancy; Al-based planning methods; FMS architectures; flexible flow shops; flexible manufacturing cells; flexible manufacturing systems; general job shops; multicommodity network flow problems; multistage multicommodity network formulation; network flow modeling; process planning problem; processing networks; redundancy; reentrant lines; resource allocation; simultaneous routing; Constraint optimization; Flexible manufacturing systems; Job shop scheduling; Manufacturing processes; Process planning; Robustness; Routing; Steady-state; Throughput; USA Councils;
Conference_Titel :
Decision and Control, 2006 45th IEEE Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-0171-2
DOI :
10.1109/CDC.2006.377645