Title :
Thermoelectric properties of multi-layered system
Author :
Nishio, Y. ; Hirano, T.
Author_Institution :
MEC Lab, Daikin Ind. Ltd., Tsukuba, Japan
Abstract :
Thermoelectric properties of multi-layered system is investigated theoretically. It is shown that the figure of merit can be improved by eliminating the contributions from low energy carriers to transport processes. Thus the barrier layers which enhance the low energy scattering can be used to eliminate the contributions from the low energy carriers. Appropriate thickness of the barrier layer is estimated by using transmission probability for a single potential barrier. Scattering probability due to multiple potential barriers are derived intuitively and transport coefficients are calculated based on this scattering probability
Keywords :
multilayers; surface scattering; thermoelectricity; barrier layers; figure of merit; low energy carriers; low energy scattering; multi-layered system; multiple potential barriers; scattering probability; single potential barrier; thermoelectric properties; thickness; transmission probability; transport coefficients; transport processes; Chemicals; Conductivity; Grain boundaries; Laboratories; Probability; Reactive power; Scattering; Sputtering; Thermoelectricity; Transistors;
Conference_Titel :
Thermoelectrics, 1998. Proceedings ICT 98. XVII International Conference on
Conference_Location :
Nagoya
Print_ISBN :
0-7803-4907-5
DOI :
10.1109/ICT.1998.740330
