Title :
Track-edge noise versus erasure state
Author :
Martin, B.D. ; Lambeth, D.N.
Author_Institution :
Carnegie Mellon University
Keywords :
Character generation; Computer hacking; Data storage systems; Linear approximation; Magnetic heads; Noise figure; Noise generators; Noise level; Transistors; Voltage;
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
DOI :
10.1109/INTMAG.1992.696665
