DocumentCode :
2480480
Title :
Thermal characterization of cloud workloads on a power-efficient server-on-chip
Author :
Milojevic, Dragomir ; Idgunji, S. ; Jevdjic, Djordje ; Ozer, Emre ; Lotfi-Kamran, Pejman ; Panteli, A. ; Prodromou, A. ; Nicopoulos, C. ; Hardy, Damien ; Falsari, B. ; Sazeides, Yiannakis
fYear :
2012
fDate :
Sept. 30 2012-Oct. 3 2012
Firstpage :
175
Lastpage :
182
Abstract :
We propose a power-efficient many-core server-on-chip system with 3D-stacked Wide I/O DRAM targeting cloud workloads in datacenters. The integration of 3D-stacked Wide I/O DRAM on top of a logic die increases available memory bandwidth by using dense and fast Through-Silicon Vias (TSVs) instead of off-chip IOs, enabling faster data transfers at much lower energy per bit. We demonstrate a methodology that includes full-system microarchitectural modeling and rapid virtual physical prototyping with emphasis on the thermal analysis. Our findings show that while executing CPU-centric benchmarks (e.g. SPECInt and Dhrystone), the temperature in the server-on-chip (logic+DRAM) is in the range of 175-200°C at a power consumption of less than 20W, exceeding the reliable operating bounds without any cooling solutions, even with embedded cores. However, with real cloud workloads, the power density in the server-on-chip remains much below the temperatures reached by the CPU-centric workloads as a result of much lower power burnt by memory-intensive cloud workloads. We show that such a server-on-chip system is feasible with a low-cost passive heat sink eliminating the need for a high-cost active heat sink with an attached fan, creating an opportunity for overall cost and energy savings in datacenters.
Keywords :
DRAM chips; cloud computing; multiprocessing systems; system-on-chip; thermal analysis; three-dimensional integrated circuits; 3D-stacked wide I/O DRAM; CPU-centric benchmarks; Dhrystone; SPECInt; TSV; datacenters; full-system microarchitectural modeling; logic die; logic+DRAM; memory bandwidth; memory-intensive cloud workloads; power-efficient many-core server-on-chip system; rapid virtual physical prototyping; temperature 175 C to 200 C; thermal analysis; thermal characterization; through-silicon vias; Bandwidth; Clouds; Density measurement; Power system measurements; Random access memory; System-on-a-chip; Through-silicon vias;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design (ICCD), 2012 IEEE 30th International Conference on
Conference_Location :
Montreal, QC
ISSN :
1063-6404
Print_ISBN :
978-1-4673-3051-0
Type :
conf
DOI :
10.1109/ICCD.2012.6378637
Filename :
6378637
Link To Document :
بازگشت