Title :
ADC test development tool kit
Author :
Liggiero, R. ; Donovan, K. ; Max, S.M. ; Tilden, S.
Author_Institution :
LTX-Credence, Norwood, MA, USA
Abstract :
A new meaning to “Signature Analysis” as it relates to Analog to Digital Converters (ADCs) and releasing products to production is presented. This paper will expand the reader´s skill set with advanced techniques to analyze data from ADCs that justifies device performance. The technique will also be a valuable tool to develop intellectual property that enhances an ADC product line performance. The concepts and calculations will benefit test engineers.
Keywords :
analogue-digital conversion; ADC test development tool kit; analog to digital converters; intellectual property; signature analysis; test engineers; Correlation; Histograms; Instruments; Performance evaluation; Signal to noise ratio; Standards;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
Conference_Location :
Graz
Print_ISBN :
978-1-4577-1773-4
DOI :
10.1109/I2MTC.2012.6229416
