DocumentCode :
2480890
Title :
Thermoelectric properties of Bi2Te3/Sb2 Te3 superlattice structure
Author :
Yamasaki, I. ; Yamanaka, R. ; Mikami, M. ; Sonobe, H. ; Mori, Y. ; Sasaki, T.
Author_Institution :
Energy Conversion Labs., Sharp Corp., Nara, Japan
fYear :
1998
fDate :
24-28 May 1998
Firstpage :
210
Lastpage :
213
Abstract :
Recently, it has been proposed that the use of superlattice structure is effective for reduction of lattice thermal conductivity in the direction perpendicular to superlattice interfaces which can lead to improvement of figure of merit. In this work, we have evaluated the thermal conductivity of Bi2Te3 and Sb2Te3 superlattice structure films. Pulsed laser deposition (PLD) has been employed as film formation method because it can easily make superlattice structure by ablating targets alternately. Bi2Te3 and Sb2Te3 films were grown respectively and effects of substrate temperature and laser power density on crystallinity, morphology and composition were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM) and energy dispersive X-ray analysis (EDX). Bi2Te3/Sb 2Te3 superlattice structure films were grown with superlattice periods of 10 nm, 20 nm and 80 nm. Thermal conductivities were measured in the direction perpendicular to superlattice interfaces by a novel method specially developed by our group. We compared the thermal conductivities of Bi2Te3/Sb2Te 3 superlattice structure films with that of Bi2Te 3 single film. The results indicates that the involvement of superlattice structure into thermoelectric film is effective for the reduction of thermal conductivity and moreover, thermal conductivity becomes smaller as superlattice-period becomes shorter as predicted
Keywords :
X-ray diffraction; antimony compounds; bismuth compounds; pulsed laser deposition; scanning electron microscopy; semiconductor materials; semiconductor superlattices; thermal conductivity; thermoelectricity; Bi2Te3; Bi2Te3/Sb2Te3 superlattice structure; EDX; SEM; Sb2Te3; X-ray diffraction; composition; crystallinity; energy dispersive X-ray analysis; figure of merit; film formation method; laser power density; lattice thermal conductivity; morphology; pulsed laser deposition; scanning electron microscopy; substrate temperature; superlattice-period; thermoelectric properties; Bismuth; Conductive films; Lattices; Pulsed laser deposition; Scanning electron microscopy; Superlattices; Tellurium; Thermal conductivity; Thermoelectricity; X-ray lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermoelectrics, 1998. Proceedings ICT 98. XVII International Conference on
Conference_Location :
Nagoya
ISSN :
1094-2734
Print_ISBN :
0-7803-4907-5
Type :
conf
DOI :
10.1109/ICT.1998.740354
Filename :
740354
Link To Document :
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