Title :
Fault diagnosis approach based on probabilistic neural network and wavelet analysis
Author :
Yang, Qing ; Gu, Lei ; Wang, Dazhi ; Wu, Dongsheng
Author_Institution :
Sch. of Photo-Electron. Eng., Changchun Univ. of Sci. & Technol., Changchun
Abstract :
A fault diagnosis method based on probabilistic neural network and Harr wavelet (HWPNN) to Tennessee Eastman (TE) process was presented. Noises and outliers in the data were firstly eliminated by Harr wavelet, and then the denoised data were used in probabilistic neural network to diagnose the faults. To validate the performance and effectiveness of the proposed scheme, the HWPNN was applied to diagnose the faults in TE process, and the classification accuracies of the classifiers were compared. The results showed that significant improvement in diagnosis accuracy was achieved by using HWPNN. HWPNN is better than PNN in classification ability and fault diagnosis accuracy.
Keywords :
Haar transforms; chemical engineering computing; fault diagnosis; neural nets; pattern clustering; probability; wavelet transforms; Harr wavelet; Tennessee Eastman process; data denoising; fault diagnosis approach; probabilistic neural network; wavelet analysis; Fault detection; Fault diagnosis; Harmonic analysis; Information science; Intelligent control; Neural networks; Signal analysis; Tellurium; Wavelet analysis; Wavelet domain; TE process; fault diagnosis; probabilistic neural network; wavelet;
Conference_Titel :
Intelligent Control and Automation, 2008. WCICA 2008. 7th World Congress on
Conference_Location :
Chongqing
Print_ISBN :
978-1-4244-2113-8
Electronic_ISBN :
978-1-4244-2114-5
DOI :
10.1109/WCICA.2008.4593194