Title :
Magnetization reversal mechanism evaluated by rotational hysteresis loss analysis for the thin film media
Author :
Takahashi, M. ; Shimatsu, T. ; Suekane, M. ; Miyamura, M. ; Yamaguchi, K. ; Yamasaki, H.
Author_Institution :
Tohoku University
Keywords :
Anisotropic magnetoresistance; Glass; Magnetic analysis; Magnetic anisotropy; Magnetic field measurement; Magnetic films; Magnetic hysteresis; Magnetization reversal; Perpendicular magnetic anisotropy; Transistors;
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
DOI :
10.1109/INTMAG.1992.696668