Title :
Thermoelectric properties of Re-Si nanocrystalline composites
Author :
Burkov, A.T. ; Heinrich, A. ; Nakama, T. ; Pitschke, W. ; Schumann, J. ; Yagasaki, K.
Author_Institution :
Dept. of Phys., Ryukyus Univ., Okinawa, Japan
Abstract :
In this report the results on the phase formation and transport properties of amorphous and nanocrystalline Re-Si thin film composites are presented. We use the composites as a model material to investigate the effect of a reduced grain size and inter-grain interfaces on the thermoelectric properties. We found that, both, the phase composition and the crystalline grain size appear to be important parameters for thermoelectric material optimisation. The results suggest that the thermoelectric parameters of a nanocrystalline composite can be superior to those of the conventional poly- or single-crystalline material of the same composition
Keywords :
amorphous state; annealing; composite materials; grain size; nanostructured materials; rhenium; silicon; sputtered coatings; thermoelectricity; thin films; Re-Si; amorphous composites; grain size; inter-grain interfaces; nanocrystalline composites; phase composition; phase formation; thermoelectric properties; thin film; Amorphous materials; Composite materials; Conducting materials; Crystalline materials; Crystallization; Failure analysis; Grain size; Semiconductor films; Solid state circuits; Thermoelectricity;
Conference_Titel :
Thermoelectrics, 1998. Proceedings ICT 98. XVII International Conference on
Conference_Location :
Nagoya
Print_ISBN :
0-7803-4907-5
DOI :
10.1109/ICT.1998.740359
