• DocumentCode
    2481103
  • Title

    Thermoelectric properties of SiC thin films

  • Author

    Kawahara, T. ; Inai, H. ; Okamoto, Y. ; Morimoto, J.

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Nat. Defense Acad., Yokosuka, Japan
  • fYear
    1998
  • fDate
    24-28 May 1998
  • Firstpage
    260
  • Lastpage
    263
  • Abstract
    Silicon carbide is expected to be a hard thermoelectric material which can be used at high temperature. Recently, a low dimensional structure has been fabricated as new materials such as thin films. We made thin films of SiC by the evaporation technique with several metal dopants which are silver, nickel and copper. These dopants act as p-type acceptors and could reduce the resistance of SiC and raise the performance as thermoelectric materials. In the 5 wt.% Ag doped samples, the thermoelectric power is about 10 μV/K at 500°C and the temperature dependence of the thermoelectric power is weak in all samples. The thermoelectric power is smaller than that of the bulk samples with the same dopants for SiC/Cu and SiC/Ag, and larger for SiC/Ni. The electrical conductivity increases as temperature increases. SiC/Ag thin films have large conductivity compared with the bulk samples. In the SiC/Ni films, the conductivity is also enhanced and the thermoelectric properties are improved at high temperature
  • Keywords
    copper; electrical conductivity; impurity states; nickel; semiconductor thin films; silicon compounds; silver; thermoelectric power; wide band gap semiconductors; 500 C; SiC thin films; SiC:Ag; SiC:Cu; SiC:Ni; SiC:Ni,Cu,Ag; copper; electrical conductivity; evaporation technique; hard thermoelectric material; high temperature; low dimensional structure; nickel; p-type acceptors; silicon carbide; silver; temperature dependence; thermoelectric properties; Conductive films; Conductivity; Copper; Nickel; Silicon carbide; Silver; Temperature dependence; Thermal resistance; Thermoelectricity; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 1998. Proceedings ICT 98. XVII International Conference on
  • Conference_Location
    Nagoya
  • ISSN
    1094-2734
  • Print_ISBN
    0-7803-4907-5
  • Type

    conf

  • DOI
    10.1109/ICT.1998.740367
  • Filename
    740367