Title :
TCAD simulation of photodetector spectral response
Author :
Jacob, Biju ; Klemenc, Michaela ; Petit, Christophe ; Witzig, Andreas ; Fichtner, Wolfgang
Author_Institution :
Integrated Syst. Laboratory, Zurich, Switzerland
Abstract :
In this paper, the spectral responsivity of a photodetector is determined by extracting optical parameters (refractive index and extinction coefficients) from the reflectivity measurement data and by treating the surface recombination velocity as a free parameter. A transfer matrix method based model has been implemented to compute the optical fields within the device. The electrical simulation was performed using ISE TCAD simulation package.
Keywords :
electroreflectance; extinction coefficients; integrated optoelectronics; optical communication equipment; optical fibre communication; p-i-n photodiodes; photodetectors; refractive index; semiconductor device models; surface recombination; ISE TCAD simulation package; electrical simulation; extinction coefficients; photodetector spectral response; reflectivity measurement data; refractive index; surface recombination velocity; transfer matrix method; Computational modeling; Data mining; Extinction coefficients; Optical computing; Optical refraction; Optical variables control; Photodetectors; Reflectivity; Refractive index; Velocity measurement;
Conference_Titel :
Numerical Simulation of Semiconductor Optoelectronic Devices, 2003. NUSOD 2003. Proceedings of the IEEE/LEOS 3rd International Conference on
Print_ISBN :
0-7803-7992-6
DOI :
10.1109/NUSOD.2003.1259032
