Title :
Sine-fit versus DFT-based algorithms in SNR testing of waveform digitizers
Author :
Bertocco, M. ; Narduzzi, C.
Author_Institution :
Dipartimento di Elettronica e Inf., Padova Univ., Italy
Abstract :
An analysis is given of the performances of DFT-based algorithms employed in SNR testing of digitizers, compared to sine-fit procedures.
Keywords :
analogue-digital conversion; automatic testing; design for testability; digital storage oscilloscopes; discrete Fourier transforms; electronic equipment testing; frequency-domain analysis; quantisation (signal); signal sampling; wave analysers; DFT-based algorithms; SNR testing; algorithm performance; comparative evaluation; digital synthesizer; digitizing oscilloscopes; frequency domain estimation; quantization; sampling frequency; sine-fit procedures; waveform digitizers; Algorithm design and analysis; Discrete Fourier transforms; Frequency estimation; Oscilloscopes; Parameter estimation; Performance analysis; Sampling methods; Signal processing algorithms; Signal to noise ratio; Testing;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location :
Braunschweig, Germany
Print_ISBN :
0-7803-3376-4
DOI :
10.1109/CPEM.1996.547341
