DocumentCode :
2481453
Title :
Microstructures and thermoelectric properties of (FeSb3) 1-xLax ribbons
Author :
Kitagawa, H. ; Hasaka, M. ; Morimura, T. ; Kondo, S.
Author_Institution :
Dept. of Mater. Sci. & Eng., Nagasaki Univ., Japan
fYear :
1998
fDate :
24-28 May 1998
Firstpage :
334
Lastpage :
337
Abstract :
The microstructures and thermoelectric properties of the spin-cast (FeSb3)1-xLax (x=0-0.4) ribbons were investigated by means of X-ray diffraction measurements, transmission electron microscopic observations, EDX analyses, measurements of the electrical resistivity and thermoelectromotive force. The ribbons consist of various structures : FeSb2+Sb for x=0, LaFe4 Sb12+FeSb2+Sb for x=0.1, LaFe4Sb 12 for x=0.2, LaFe4Sb12+La2Sb+LaSb+LaSb2 +FeSb for x=0.3 and 0.4, where LaFe4Sb12 is the filled skutterudite structure. A precipitation zone appeared along the grain boundaries of LaFe4Sb12 for x>0.2, while it was not seen for x<0.2. As the amount of LaFe4Sb 12 decreases with deviation from x=0.2, the electrical resistivity decreases more rapidly for x>0.2 than for x<0.2. The Seebeck coefficient is large between x=0.2 and 0.3. The large power factor is obtained between x=0.2 and 0.3, being the high value of 20 μW/cmK2 at 350 K and 50 μW/cmK2 at 550 K
Keywords :
Seebeck effect; X-ray diffraction; crystal microstructure; electrical resistivity; iron compounds; lanthanum compounds; thermoelectricity; transmission electron microscopy; (FeSb3)1-xLax ribbons; FeLaSb3; Seebeck coefficient; X-ray diffraction; electrical resistivity; filled skutterudite structure; microstructures; precipitation zone; thermoelectric properties; thermoelectromotive force; transmission electron microscopy; Electric resistance; Electric variables measurement; Force measurement; Grain boundaries; Microstructure; Reactive power; Thermal force; Thermoelectricity; Transmission electron microscopy; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermoelectrics, 1998. Proceedings ICT 98. XVII International Conference on
Conference_Location :
Nagoya
ISSN :
1094-2734
Print_ISBN :
0-7803-4907-5
Type :
conf
DOI :
10.1109/ICT.1998.740388
Filename :
740388
Link To Document :
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