DocumentCode :
2481479
Title :
An efficient approximation for Maximum Likelihood estimation of ADC parameters
Author :
Sárhegyi, Attila ; Balogh, László ; Kollár, István
Author_Institution :
Cypress Semicond. Corp., Hungary
fYear :
2012
fDate :
13-16 May 2012
Firstpage :
2656
Lastpage :
2661
Abstract :
Maximum Likelihood (ML) estimation is applied for estimating ADC parameters in several papers. However, none of them provided an efficient way to calculate the code transition levels for sine wave excitation signals. Due to the vast amount of data points and parameters, the complexity of the estimation for high resolution ADCs is overwhelming. The general ML cost function is already published in [1] [14] for Gaussian noise where the algorithm involves calculations with the erf function. In order to be able to accelerate the algorithm, approximations are needed. An efficient approximation is proposed below which applies Laplacian noise model. In this case the likelihood function consists of only exponentials which simplifies the calculation. After finding the parameters, which are close to those for the Gaussian distribution, they can be adjusted to the Gaussian noise model. This approach not necessarily requires a Gaussian noise distribution. Simulation results show the the bias of the code transition level estimation is not necessarily dependent on the shape of the noise distribution.
Keywords :
Gaussian noise; analogue-digital conversion; maximum likelihood estimation; ADC parameters; Gaussian noise; Laplacian noise model; code transition levels; data points; maximum likelihood estimation; sine wave excitation signals; Gaussian noise; Histograms; Laplace equations; Mathematical model; Maximum likelihood estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
Conference_Location :
Graz
ISSN :
1091-5281
Print_ISBN :
978-1-4577-1773-4
Type :
conf
DOI :
10.1109/I2MTC.2012.6229449
Filename :
6229449
Link To Document :
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