• DocumentCode
    2481520
  • Title

    Engineering crossbar based emerging memory technologies

  • Author

    Kannan, Sachhidh ; Rajendran, Jeyavijayan ; Karri, Ramesh ; Sinanoglu, Ozgur

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Polytech. Inst. of New York Univ., Brooklyn, NY, USA
  • fYear
    2012
  • fDate
    Sept. 30 2012-Oct. 3 2012
  • Firstpage
    478
  • Lastpage
    479
  • Abstract
    Emerging Resistive Random Access Memories (RRAM) devices are an attractive option for future memory architectures due to their low-power and high density. However, their capacity is limited by sneak paths and the sensitivity of the sense amplifiers (SA). We develop a framework to maximize the capacity of RRAM memories by modeling the interactions between memory capacity, sneak paths, device parameters, and the sense amplifier. The framework explores the design space of the memory by considering different read/write mechanisms, sneak path elimination techniques, and multi-level storage.
  • Keywords
    memory architecture; random-access storage; RRAM; SA; emerging memory technologies; emerging resistive random access memories; engineering crossbar; memory architectures; sense amplifiers; Equations; Mathematical model; Optimization; Phase change materials; Random access memory; Resistance; Sensitivity; Resistive RAM; emerging memory technologies; memory design; optimization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design (ICCD), 2012 IEEE 30th International Conference on
  • Conference_Location
    Montreal, QC
  • ISSN
    1063-6404
  • Print_ISBN
    978-1-4673-3051-0
  • Type

    conf

  • DOI
    10.1109/ICCD.2012.6378682
  • Filename
    6378682