DocumentCode :
2481520
Title :
Engineering crossbar based emerging memory technologies
Author :
Kannan, Sachhidh ; Rajendran, Jeyavijayan ; Karri, Ramesh ; Sinanoglu, Ozgur
Author_Institution :
Dept. of Electr. & Comput. Eng., Polytech. Inst. of New York Univ., Brooklyn, NY, USA
fYear :
2012
fDate :
Sept. 30 2012-Oct. 3 2012
Firstpage :
478
Lastpage :
479
Abstract :
Emerging Resistive Random Access Memories (RRAM) devices are an attractive option for future memory architectures due to their low-power and high density. However, their capacity is limited by sneak paths and the sensitivity of the sense amplifiers (SA). We develop a framework to maximize the capacity of RRAM memories by modeling the interactions between memory capacity, sneak paths, device parameters, and the sense amplifier. The framework explores the design space of the memory by considering different read/write mechanisms, sneak path elimination techniques, and multi-level storage.
Keywords :
memory architecture; random-access storage; RRAM; SA; emerging memory technologies; emerging resistive random access memories; engineering crossbar; memory architectures; sense amplifiers; Equations; Mathematical model; Optimization; Phase change materials; Random access memory; Resistance; Sensitivity; Resistive RAM; emerging memory technologies; memory design; optimization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design (ICCD), 2012 IEEE 30th International Conference on
Conference_Location :
Montreal, QC
ISSN :
1063-6404
Print_ISBN :
978-1-4673-3051-0
Type :
conf
DOI :
10.1109/ICCD.2012.6378682
Filename :
6378682
Link To Document :
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