DocumentCode
2481520
Title
Engineering crossbar based emerging memory technologies
Author
Kannan, Sachhidh ; Rajendran, Jeyavijayan ; Karri, Ramesh ; Sinanoglu, Ozgur
Author_Institution
Dept. of Electr. & Comput. Eng., Polytech. Inst. of New York Univ., Brooklyn, NY, USA
fYear
2012
fDate
Sept. 30 2012-Oct. 3 2012
Firstpage
478
Lastpage
479
Abstract
Emerging Resistive Random Access Memories (RRAM) devices are an attractive option for future memory architectures due to their low-power and high density. However, their capacity is limited by sneak paths and the sensitivity of the sense amplifiers (SA). We develop a framework to maximize the capacity of RRAM memories by modeling the interactions between memory capacity, sneak paths, device parameters, and the sense amplifier. The framework explores the design space of the memory by considering different read/write mechanisms, sneak path elimination techniques, and multi-level storage.
Keywords
memory architecture; random-access storage; RRAM; SA; emerging memory technologies; emerging resistive random access memories; engineering crossbar; memory architectures; sense amplifiers; Equations; Mathematical model; Optimization; Phase change materials; Random access memory; Resistance; Sensitivity; Resistive RAM; emerging memory technologies; memory design; optimization;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design (ICCD), 2012 IEEE 30th International Conference on
Conference_Location
Montreal, QC
ISSN
1063-6404
Print_ISBN
978-1-4673-3051-0
Type
conf
DOI
10.1109/ICCD.2012.6378682
Filename
6378682
Link To Document