Title :
A test standard for calibrating high accurate ADC and DAC
Author :
Tong Guangqui ; Zhang Xiuzeng
Author_Institution :
Heping Street, Beijing, China
Abstract :
In this paper, a test standard system for measuring ADC and DAC is introduced. By a computer, ADC and DAC can be measured automatically with 24 bits resolution and 1 ppm linearity. The testing speed can be up to 10 KHz.
Keywords :
analogue-digital conversion; automatic test equipment; automatic test software; digital-analogue conversion; field buses; 10 kHz; 24 bit; ADC; DAC; automatic measurement; calibration; high accuracy; internal controller; measurement bus; parallel interface; test software; test standard system; testing speed; Assembly; Hardware; Linearity; Measurement standards; Read-write memory; Signal processing; Switches; Testing; Visual BASIC;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location :
Braunschweig, Germany
Print_ISBN :
0-7803-3376-4
DOI :
10.1109/CPEM.1996.547343
