Title :
Method for Diagnosis Test Reliability Assessment Based on Bayesian Network
Author :
Wang, Hong-Xia ; Ye, Xiao-Hui ; Pan, Jia-Liang
Author_Institution :
Electron. Eng. Dept., Naval Univ. of Eng., Wuhan, China
Abstract :
Diagnostic test has an important role in the fault diagnosis. This paper presents a method for test reliability assessment based on Bayesian network. The reliability model for diagnosis test is gotten based on dependency matrix of fault and test. Then the Bayesian model is gotten through the reliability data obtained by probabilities of fault and the detection probabilities. From the examples, conclusion can be drown that not only the failed test probabilities could be computed by the Bayesian model but also the fault components could be inferred based on fault probabilities when the test is failed.
Keywords :
belief networks; fault diagnosis; reliability theory; Bayesian network; dependency matrix; diagnosis test reliability assessment; fault diagnosis; Bayesian methods; Educational institutions; Electronic equipment testing; Fault detection; Fault diagnosis; Power system faults; Power system reliability; Reliability engineering; System testing; Uncertainty;
Conference_Titel :
Intelligent Systems and Applications (ISA), 2010 2nd International Workshop on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-5872-1
Electronic_ISBN :
978-1-4244-5874-5
DOI :
10.1109/IWISA.2010.5473430