DocumentCode
2481871
Title
Non-enumerative generation of statistical path delays for ATPG
Author
Somashekar, Ahish Mysore ; Tragoudas, Spyros ; Gangadhar, Sreenivas ; Jayabharathi, Rathish
Author_Institution
ECE Dept., Southern Illinois Univ., Carbondale, IL, USA
fYear
2012
fDate
Sept. 30 2012-Oct. 3 2012
Firstpage
514
Lastpage
515
Abstract
A Monte Carlo based approach capable of identifying the probability distributions that describe the delay of every sensitizable path in a path implicit manner is proposed. It is shown experimentally that the statistical information for all paths is generated as fast as the traditional Monte Carlo simulation that identifies the probability density function for the circuit delay.
Keywords
Monte Carlo methods; automatic test pattern generation; binary decision diagrams; circuit testing; delay circuits; delays; logic testing; statistical distributions; ATPG; Monte Carlo based approach; Monte Carlo simulation; circuit delay; nonenumerative generation; probability density function; probability distribution; sensitizable path delay; statistical information; statistical path delay; Circuit faults; Data structures; Delay; Logic gates; Monte Carlo methods; Probability distribution; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design (ICCD), 2012 IEEE 30th International Conference on
Conference_Location
Montreal, QC
ISSN
1063-6404
Print_ISBN
978-1-4673-3051-0
Type
conf
DOI
10.1109/ICCD.2012.6378700
Filename
6378700
Link To Document