Title :
One dimensional optical data links
Author_Institution :
AT&T Bell Labs., Naperville, IL, USA
Abstract :
Demands for increased interconnection density and higher bandwidth, coupled with stringent cost constraints of advanced wide bandwidth telecommunication switching and high throughput computer architectures, are exhausting conventional electrical interconnection techniques. The requirement for greater interconnection performance, spawned in part by the advances in integrated circuit technologies and the need for enhanced digital services (such as multi media), dictate that technology advancement must occur in traditional electronic packaging and/or interconnection schemes. Presently a “bottle-neck” occurs at the board-to-board level of the interconnection hierarchy. Therefore, an opportunity exists for the development of new parallel optical interconnection techniques which can be incorporated into system designs beginning at this interconnection level and beyond
Keywords :
computer architecture; data communication; integrated circuit technology; optical fibre networks; optical interconnections; optical links; packaging; parallel architectures; photonic switching systems; advanced wide bandwidth telecommunication switching; board-to-board level; bottle-neck; digital services; electrical interconnection techniques; electronic packaging; high throughput computer architectures; higher bandwidth; integrated circuit technologies; interconnection density; interconnection hierarchy; interconnection level; interconnection performance; interconnection schemes; multi media; one dimensional optical data links; parallel optical interconnection techniques; stringent cost constraints; system designs; Bandwidth; Computer architecture; Costs; Coupling circuits; Electronics packaging; Integrated circuit interconnections; Integrated circuit technology; Optical interconnections; Telecommunication switching; Throughput;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1993. LEOS '93 Conference Proceedings. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-1263-5
DOI :
10.1109/LEOS.1993.379273