Title :
An evaluation of energy storage techniques for improving ride-through capability for sensitive customers on underground networks
Author :
Bra, Aubrey ; Hofmann, P. ; Mauro, Ralph ; Melhorn, Christopher J.
Author_Institution :
Con Edison, New York, NY, USA
Abstract :
Most Con Edison customers are supplied through extensive secondary network systems. These customers do not experience interruptions or outages except under very rare circumstances. This is a significant advantage for these customers since they do not normally need to apply conventional UPS systems for protection of critical loads against outages. However, voltage sags, which occur whenever there is a fault on the power system, can cause dropout or mis-operation of sensitive equipment. Some type of protection may be needed for these loads to provide ride through support during voltage sags. This paper describes the methodology used in a research project sponsored by EPRI and Con Edison to evaluate the need for voltage sag ride through improvement for selected customers. Technologies that can supply the required ride through and application considerations were evaluated (SMES, motor-generator sets). Two case studies are presented to illustrate the methodology used to perform the evaluations
Keywords :
electric motors; power systems; superconducting magnet energy storage; synchronous generators; underground distribution systems; Con Edison; EPRI; SMES; energy storage techniques; harmonics; motor-generator; power quality; power system fault; ride-through capability improvement; secondary network systems; sensitive customers; underground networks; voltage regulation; voltage sags; Broadcasting; Computerized monitoring; Condition monitoring; Energy storage; Power engineering and energy; Power quality; Power system protection; Power system stability; Uninterruptible power systems; Voltage fluctuations;
Conference_Titel :
Industrial and Commercial Power Systems Technical Conference, 1996. Conference Record, Papers Presented at the 1996 Annual Meeting., IEEE 1996
Conference_Location :
New Orleans, LA
Print_ISBN :
0-7803-3263-6
DOI :
10.1109/ICPS.1996.533937