Title :
The contact resistance of rolling silver coated copper contacts
Author :
Rudolphi, Åsa Kassman ; Jacobson, Staffan
Author_Institution :
Mater. Sci., Uppsala Univ., Sweden
Abstract :
In contrast to most mechanical components electrical contacts require plastic deformation to fulfil their main function. The high contact forces in combination with a large risk for vibrations make gross plastic fretting an important degradation mechanism in the field of electrical contacts. As established in the field of fretting under near elastic conditions, three fretting regimes are distinguished also in gross plastic fretting. All three regimes involve plastic deformation which have distinct effects on the surface damage, the friction and the adhesion to the counter face. The regime prevailing is primarily determined by the combination of fretting amplitude and normal load. In this investigation the influence of rolling on the contact performance has been studied for a crossed cylinders model contact. The contact materials were silver coated (2 or 15 /spl mu/m) copper with an intermediate nickel layer (50 /spl mu/m) and silver coated (20 /spl mu/m) copper both in a clean and in a pre-corroded condition. Also grease lubricated contacts were tested. This paper shows that the surface damage is substantially reduced if one of the cylinders in the crossed cylinders test is free to rotate as compared with a regular fretting contact where both cylinders are fixed.
Keywords :
adhesion; contact resistance; copper; electrical contacts; lubrication; plastic deformation; rolling friction; silver; vibrations; wear; Cu-Ag; adhesion; contact force; contact resistance; crossed cylinders model; degradation; electrical contact; friction; grease lubricant; gross plastic fretting; mechanical component; plastic deformation; rolling silver coated copper contact; surface damage; vibration; Adhesives; Contact resistance; Copper; Counting circuits; Degradation; Friction; Plastics; Silver; Testing; Vibrations;
Conference_Titel :
Electrical Contacts, 1997., Proceedings of the Forty-Third IEEE Holm Conference on
Conference_Location :
Philadelphia, PA, USA
Print_ISBN :
0-7803-3968-1
DOI :
10.1109/HOLM.1997.637872