DocumentCode
2482231
Title
Vacuum arc research expands interpretation of test data from vacuum interrupters
Author
Schulman, M. Bruce ; Smith, R. Kirkiand
Author_Institution
Cutler-Hammer, Horseheads, NY, USA
fYear
1996
fDate
6-9 May 1996
Firstpage
83
Lastpage
90
Abstract
Using high-speed movies of vacuum arcs between spiral contacts in conjunction with floating arc shields, the arc voltage, current and contact travel have been correlated with arc behaviors. These arc behaviors can be described by arc appearance diagrams in gap-current space. These allow the waveforms from high-power tests on spiral-contact vacuum interrupters to be evaluated for information on the internal arcing behavior and arc-induced damage. We have found that arc voltage traces can be examined during interruption testing to help in judging the probability that a vacuum interrupter will continue to pass additional interruption trials. The arc voltage also reveals signs of damage to the contacts, such as melting caused by a prolonged interval of a stationary high-current arc column. This information enhances the statistics we use in single-phase pass/fail testing of interrupters to assess manufacturing quality and the probability that new designs will pass three-phase certification. Correlation of arc voltage traces with the arc appearance and arc motion is also discussed for butt-type contacts, axial magnetic field contacts, and radial magnetic field slotted-cup contacts
Keywords
circuit-breaking arcs; electrical contacts; magnetic fields; switchgear testing; vacuum arcs; vacuum interrupters; arc current; arc voltage; arc-induced damage; axial magnetic field contacts; butt-type contacts; contact travel; floating arc shields; internal arcing behavior; interruption testing; melting; radial magnetic field slotted-cup contacts; single-phase pass/fail testing; spiral contacts; spiral-contact vacuum interrupters; test data interpretation; three-phase certification; vacuum arc research; Interrupters; Magnetic fields; Motion pictures; Probability; Space exploration; Spirals; Statistical analysis; Testing; Vacuum arcs; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial and Commercial Power Systems Technical Conference, 1996. Conference Record, Papers Presented at the 1996 Annual Meeting., IEEE 1996
Conference_Location
New Orleans, LA
Print_ISBN
0-7803-3263-6
Type
conf
DOI
10.1109/ICPS.1996.533940
Filename
533940
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