Efficient execution of ADC test with sine fitting with verification of excitation signal parameter settings

In this paper a frequency domain four-parameter sine wave fit algorithm is presented which is much faster than the standard time domain least squares fit for large number of samples, with almost the same precision. This allows the user to check if the strict conditions described in the standard for testing analog-to-digital converters are met. Furthermore in special cases it is also possible to make corrections in the input to avoid mistakenly identified errors in the characteristic of the A/D converter.