Title :
Fault resistant CRT-RSA scheme adopting a small exponent
Author :
Park, JeaHoon ; Park, EunYoung ; Moon, SangJae ; Choi, Dooho ; Kang, YouSung ; Ha, JaeCheol
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Kyungpook Nat. Univ., Daegu, South Korea
fDate :
Nov. 30 2010-Dec. 2 2010
Abstract :
This paper considers a secure and efficient CRT-RSA scheme resistant to fault attacks. Recently, Boscher et al. proposed a secure CRT-RSA scheme by verifying signature using a public exponent. However, it is almost two times slower compared to the classical CRT-RSA signature when the exponent is expected to be a long number. We present a low-cost and secure CRT-RSA scheme by generating a small exponent for checking the correctness of signature. Furthermore, since our scheme can use fast double exponentiation algorithm based on right-to-left binary method having two exponents, it has low computational load compared to other existing schemes.
Keywords :
cryptography; digital signatures; fault tolerance; CRT-RSA signature; embedded cryptographic devices; fast double exponentiation algorithm; fault attacks; fault resistant CRT-RSA scheme; right-to-left binary method; Algorithm design and analysis; Cathode ray tubes; Complexity theory; Computational efficiency; Registers; Resistance; Security; CRT-RSA; Double exponentiation; Fault attack;
Conference_Titel :
Computer Sciences and Convergence Information Technology (ICCIT), 2010 5th International Conference on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-8567-3
Electronic_ISBN :
978-89-88678-30-5
DOI :
10.1109/ICCIT.2010.5711115