• DocumentCode
    2482740
  • Title

    Subnanosecond optical deflection in Van der Waals bonded GaAlAs-GaAs MQW: effects of carrier lifetime and electric field

  • Author

    Gratiet, L. Le ; Bedel, E. ; Grac, R. ; Fontaine, C. ; Pugnet, M.

  • Author_Institution
    Lab. d´´Anal. et d´´Archit. des Syst., CNRS, Toulouse, France
  • fYear
    1996
  • fDate
    29 Apr-3 May 1996
  • Firstpage
    329
  • Lastpage
    332
  • Abstract
    In this communication, we present preliminary results obtained on subnanosecond multiple quantum well modulators, as a step towards designing transmission deflectors. Fabrication of ultrafast transmission modulators based on GaAs/GaAlAs multiple quantum wells has been achieved by means of epitaxial lift-off. Transient grating experiments performed at high excitation energies showed diffraction efficiencies larger than 1%. The effect of a static electric field was investigated. Electric field screening has been evidenced in the picosecond regime at a pulse energy of 20 μJ/ cm2
  • Keywords
    III-V semiconductors; aluminium compounds; diffraction gratings; electro-optical modulation; gallium arsenide; high-speed optical techniques; light diffraction; semiconductor quantum wells; semiconductor superlattices; GaAlAs-GaAs; GaAs/GaAlAs multiple quantum wells; carrier lifetime; diffraction efficiencies; electric field; electric field screening; epitaxial lift-off; high excitation energies; picosecond regime; pulse energy; static electric field; subnanosecond multiple quantum well modulators; subnanosecond optical deflection; transient gratings; transmission deflectors; ultrafast transmission modulators; van der Waals bonded GaAlAs-GaAs MQW; Bonding; Contacts; Density estimation robust algorithm; Electrodes; Gallium arsenide; Optical arrays; Pollution measurement; Quantum well devices; Substrates; Writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconducting and Semi-Insulating Materials Conference, 1996. IEEE
  • Conference_Location
    Toulouse
  • Print_ISBN
    0-7803-3179-6
  • Type

    conf

  • DOI
    10.1109/SIM.1996.571112
  • Filename
    571112