• DocumentCode
    2482753
  • Title

    Driving level dependence of spontaneous emission factor in microcavity DBR surface emitting lasers

  • Author

    Hamano, T. ; Baba, T. ; Iga, K.

  • Author_Institution
    Precision & Intelligence Lab., Tokyo Inst. of Technol., Yokohama, Japan
  • fYear
    1993
  • fDate
    15-18 Nov 1993
  • Firstpage
    570
  • Lastpage
    571
  • Abstract
    Ultra low-threshold surface emitting (SE) lasers are attractive for large scale integration scheme into two-dimensional laser arrays. The control of spontaneous emission using a microcavity is one of the viable methods to realize such ultra low-threshold lasers. We have obtained the enhanced spontaneous emission factor (C factor) in three-dimensional microcavity DBR SE lasers. Recently, several groups have estimated the C factor of the microcavity SE lasers by fitting the calculated threshold curves of output-input characteristics where they assumed that the C factor was constant. However, the C factor must be changing against driving levels. In this study, we would like to show that the variable C factor provides the substantial difference in the L-I characteristic of a microcavity SE laser
  • Keywords
    distributed Bragg reflector lasers; laser beams; laser cavity resonators; quantum well lasers; semiconductor laser arrays; semiconductor lasers; spontaneous emission; surface emitting lasers; L-I characteristic; driving level dependence; large scale integration scheme; microcavity; microcavity DBR surface emitting lasers; output-input characteristics; spontaneous emission; spontaneous emission factor; two-dimensional laser arrays; ultra low-threshold lasers; ultra low-threshold surface emitting lasers; Charge carrier density; Distributed Bragg reflectors; Electrons; Gallium arsenide; Microcavities; Quantum well lasers; Resonance; Semiconductor lasers; Spontaneous emission; Surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1993. LEOS '93 Conference Proceedings. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7803-1263-5
  • Type

    conf

  • DOI
    10.1109/LEOS.1993.379316
  • Filename
    379316