Title :
Frequency modulation characteristics of absorptive-grating gain-coupled DFB lasers: spatial hole burning self-suppression effect
Author :
Sudoh, Tsurugi K. ; Nakano, Yoshiaki ; Tada, Kunio ; Kikuchi, Kazuro ; Hirata, Takaaki ; Hosomatsu, Haruo
Author_Institution :
Dept. of Electron. Eng., Tokyo Univ., Japan
Abstract :
The spatial hole burning (SHB) in distributed feedback (DFB) lasers limits longitudinal-mode stability and occasionally results in spectral linewidth broadening or multiple-mode oscillation. Introduction of gain coupling is one of effective methods to reduce SHB. However, SHB may still exist in the gain-coupled (GC) DFB laser due to inappropriate coupling strength, parasitic index coupling, and facet reflection in practical devices. This paper describes self-suppression effect of SHB in absorptive-grating GC DFB lasers which is observed through the measurement of frequency modulation (FM) characteristics. This effect is attributed to the photon-density-dependent coupling coefficient in the gain-coupled cavity
Keywords :
diffraction gratings; distributed feedback lasers; frequency modulation; laser cavity resonators; laser feedback; laser modes; laser stability; optical hole burning; optical modulation; semiconductor lasers; spectral line broadening; absorptive-grating gain-coupled DFB lasers; coupling strength; distributed feedback lasers; facet reflection; frequency modulation; gain coupling; gain-coupled cavity; longitudinal-mode stability; multiple-mode oscillation; parasitic index coupling; photon-density-dependent coupling coefficient; self-suppression effect; spatial hole burning; spatial hole burning self-suppression effect; spectral linewidth broadening; Facsimile; Frequency modulation; Gratings; Laser theory; Optical coupling; Optical modulation; Optical saturation; Photonic integrated circuits; Power lasers; Waveguide lasers;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1993. LEOS '93 Conference Proceedings. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-1263-5
DOI :
10.1109/LEOS.1993.379317
