DocumentCode :
2482834
Title :
P6H-1 Electrochemical Etching of Quartz
Author :
Rodrigue, Eric ; Kaajakari, Ville
Author_Institution :
Louisiana Tech Univ., Ruston
fYear :
2007
fDate :
28-31 Oct. 2007
Firstpage :
2586
Lastpage :
2589
Abstract :
We present the first results on the electrochemical etching of crystalline quartz. Used for bulk micromachining of silicon, electrochemical etching has not been previously explored as a method for processing quartz because of its insulating nature. By injecting energetic charge carriers into the quartz it can be made temporarily conductive, allowing current to be passed through in magnitudes which will affect the chemical etch rate. This was experimentally verified by etching samples of AT-cut quartz while bombarding the sample with electrons. Etch depths were measured and plotted as a function of current density, showing a variation of +/-3X the control etch rate. The ability to increase and decrease the etch rate can be used to define novel quartz microstructures.
Keywords :
acoustic resonators; crystal resonators; electrochemical machining; etching; piezoelectric materials; quartz; ultrasonic devices; AT cut quartz; SiO2; chemical etch rate; current density; energetic charge carrier injection; etch depth; quartz electrochemical etching; quartz insulator; temporarily conductive quartz; Charge carriers; Chemicals; Crystallization; Current measurement; Density measurement; Electrons; Etching; Insulation; Micromachining; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2007. IEEE
Conference_Location :
New York, NY
ISSN :
1051-0117
Print_ISBN :
978-1-4244-1384-3
Electronic_ISBN :
1051-0117
Type :
conf
DOI :
10.1109/ULTSYM.2007.651
Filename :
4410224
Link To Document :
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