Title :
Calibrating accelerometers using an Electromagnetic Launcher
Author :
Timpson, E.J. ; Engel, T.G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Missouri, Columbia, MO, USA
Abstract :
A Pulse Forming Network (PFN), Helical Electromagnetic Launcher (HEML), Command Module (CM), and Calibration Table (CT) were built and evaluated for the combined ability to calibrate an accelerometer. The PFN has a maximum stored energy of 19.25 kJ bank and is fired by a silicon controlled rectifier (SCR), with appropriate safety precautions. The HEML is constructed out of G-10 fiberglass and is designed to accelerate 600 grams to 10 meters per second. The CM is microcontroller based running Arduino Software. The CM has a keypad input and 7 segment outputs of the bank voltage and desired voltage. After entering a desired bank voltage, the CM controls the charge of the PFN. When the two voltages are equal it allows the fire button to send a pulse to the SCR to fire the PFN and in turn, the HEML. The HEML projectile´s tip hits a target that is held by the CT. The CT consists of a table to hold the PFN and HEML, a vacuum chuck, air bearing, velocity meter and catch pot. The Target is held with the vacuum chuck awaiting impact. After impact, the air bearing allows the target to fall freely for the velocity meter to get an accurate reading. A known acceleration is determined from the known change in velocity of the target. Thus, if an accelerometer was attached to the target, the measured value can be compared to the known value.
Keywords :
accelerometers; calibration; electromagnetic launchers; energy storage; microcontrollers; thyristors; Arduino software; CM; CT; G-10 fiberglass; HEML; PFN; SCR; accelerometer calibration; air bearing; bank voltage; calibration table; catch pot; command module; energy storage; helical electromagnetic launcher; microcontroller; pulse forming network; silicon controlled rectifier; vacuum chuck; velocity meter; Acceleration; Accelerometers; Calibration; Electromagnetics; Equations; Mathematical model; Sensitivity;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
Conference_Location :
Graz
Print_ISBN :
978-1-4577-1773-4
DOI :
10.1109/I2MTC.2012.6229531