DocumentCode :
2483559
Title :
Approximation of salient contours in cluttered scenes
Author :
Huang, Rui ; Sang, Nong ; Tang, Qiling
Author_Institution :
Inst. for Pattern Recognition & Artificial Intell., Huazhong Univ. of Sci. & Technol., Wuhan
fYear :
2008
fDate :
8-11 Dec. 2008
Firstpage :
1
Lastpage :
4
Abstract :
This paper proposes a new approach to describe the salient contours in cluttered scenes. No need to do the preprocessing, such as edge detection, we directly use a set of random straight line segments, as the intermediate level vision tokens, to approximate the salient contours. This line set is modeled by a stochastic framework, marked point process, in which the point denotes the center of lines, and the marker denotes the orientation and length of lines. Generic Gastalt factors of proximity and collinear continuity are embedded to constraint the geometrical inter-relations between lines. Different data likelihoods are used on synthetic and real images. Optimization is done by simulated annealing using Reversible Jump Markov chain Monte Carlo. Our results not only have a good approximation to the salient contours, also make other post-processing application more robust.
Keywords :
Markov processes; Monte Carlo methods; approximation theory; edge detection; stochastic processes; cluttered scenes; edge detection; marked point process; reversible jump Markov chain Monte Carlo; salient contour approximation; stochastic framework; Background noise; Detectors; Image edge detection; Image segmentation; Layout; Object oriented modeling; Pattern recognition; Simulated annealing; Solid modeling; Stochastic processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 2008. ICPR 2008. 19th International Conference on
Conference_Location :
Tampa, FL
ISSN :
1051-4651
Print_ISBN :
978-1-4244-2174-9
Electronic_ISBN :
1051-4651
Type :
conf
DOI :
10.1109/ICPR.2008.4761518
Filename :
4761518
Link To Document :
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