• DocumentCode
    2483602
  • Title

    Impact of the hollow microspheres´ filling degree on the electrical dc breakdown field strength of syntactic foam

  • Author

    Strauchs, A. ; Schnettler, A.

  • Author_Institution
    Inst. of High Voltage Technol., RWTH Aachen Univ., Aachen, Germany
  • fYear
    2012
  • fDate
    14-17 Oct. 2012
  • Firstpage
    331
  • Lastpage
    334
  • Abstract
    This paper deals with theoretical and experimental investigations on an innovative insulation material called syntactic foam. Syntactic foam is a composite dielectric consisting of a polymeric matrix with embedded hollow microspheres. The main focus of the present study is on the electrical breakdown process of syntactic foam under electrical dc field stress. Furthermore, the study deals with the impact of the hollow microspheres´ filling degree on this process. In the experiments, the electrical breakdown field strength of syntactic foam under electrical dc stress is determined. The microspheres´ filling degree varies in a range of 10...50 vol.%. The results show, that the breakdown field strength decreases, if the microspheres´ filling degree is increased. Numerical 3D field simulations of syntactic foam with different filling degrees verify the material´s behavior observed in the experiments. A model of the breakdown mechanism in syntactic foam under electrical dc stress is presented. The impact of the hollow microspheres´ filling degree on the breakdown mechanism is given.
  • Keywords
    dielectric materials; electric breakdown; filled polymers; numerical analysis; polymers; breakdown mechanism; composite dielectric; electrical breakdown process; electrical dc breakdown field strength; electrical dc field stress; electrical dc stress; embedded hollow microspheres; hollow microsphere filling degree; innovative insulation material; numerical 3D field simulations; polymeric matrix; syntactic foam; Electric breakdown; Epoxy resins; Filling; Glass; Stress; Syntactics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena (CEIDP), 2012 Annual Report Conference on
  • Conference_Location
    Montreal, QC
  • ISSN
    0084-9162
  • Print_ISBN
    978-1-4673-1253-0
  • Electronic_ISBN
    0084-9162
  • Type

    conf

  • DOI
    10.1109/CEIDP.2012.6378788
  • Filename
    6378788