Title :
A macro-micro motion system for a scanning tunneling microscope
Author :
Gilsinn, James D. ; Damazo, Bradley N. ; Silver, Richard ; Zhou, Hui
Author_Institution :
Manuf. Eng. Lab., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
As nano-lithography technology improves, more companies and research groups have the capability to create nano-scale structures. Scanning tunneling microscopes (STMs) are commonly used to create these structures and evaluate them afterward. One difficulty is that these nanostructures are difficult to find on a one centimeter-size die cut from a silicon wafer without very specialized hardware and post-processing and analysis. The National Institute of Standards and Technology (NIST) is conducting research into developing a macro-micro motion system that would allow these nano-structures to be more effectively located and identified on the die. An XY stage system using linear piezo-actuators can perform the macro motion by moving the sample to where the STM tip can scan a particular region of the die to make an analysis. The STM tip would then perform the micro motion by scanning the region for the nano-structure. A vibration isolation system has been designed for this macro-micro motion system using springs and eddy current dampers. This vibration isolation system will isolate the entire system from the outside world and the individual components from each other. A high-precision interferometer system is also installed to independently monitor a flexure driven stage for the STM tip. A graphical programming system was developed for controlling the motion of the STM tip. All of these systems combine to form the initial steps toward coordinated closed-loop control of the STM.
Keywords :
damping; interferometers; motion control; nanolithography; piezoelectric actuators; programmed control; scanning tunnelling microscopy; vibration isolation; NIST; National Institute of Standards and Technology; eddy current dampers; graphical programming; interferometer; macro-micro motion system; motion control; nanolithography; piezoelectric actuators; scanning tunneling microscopes; springs dampers; vibration isolation system; Control systems; Hardware; Microscopy; Motion analysis; NIST; Nanostructures; Performance analysis; Silicon; Springs; Tunneling;
Conference_Titel :
Automation Congress, 2002 Proceedings of the 5th Biannual World
Print_ISBN :
1-889335-18-5
DOI :
10.1109/WAC.2002.1049454