DocumentCode :
2483893
Title :
Investigation of long term stability under AC voltage stress of syntactic foam
Author :
Roggendorf, C. ; Schnettler, A.
Author_Institution :
Inst. for High Voltage Technol., RWTH Aachen Univ., Aachen, Germany
fYear :
2012
fDate :
14-17 Oct. 2012
Firstpage :
399
Lastpage :
402
Abstract :
Insulation materials of the future are confronted with a wide range of requirements such as lower weight and higher operating temperatures. Syntactic foam represents an alternative to conventional insulation materials. It consists of a polymer matrix as epoxy resin or silicone (called binder) and hollow spherical particles with a diameter in the range of 30-100 μm (microspheres) which are mixed into the binder. Syntactic foam features good electrical properties and distinguishes itself with a very low density at low material costs. Furthermore, variations of the filling degree and the kind of the microspheres used provide options to adapt a wide range of material properties for special applications. In this study syntactic foam based on epoxy resin with coated polymeric microspheres is used, which features high breakdown strength under short term ac stress. However, insulation materials have to withstand the electrical voltage stress over their complete lifetime. Therefore the long term stability under ac stress is investigated for different compounds of syntactic foam. The study includes the variation of the filling degree of microspheres and the influence of different diameters of the microspheres on the long term stability as well as the influence of additional silica particles in the syntactic foam. Partial discharge measurements are performed to discuss the influence of the different syntactic foam parameters. These investigations result in a lifetime model for syntactic foam under ac stress. This allows adjusting the material properties for each special application, which leads to the best performance of the insulation materials to provide a high reliability.
Keywords :
filled polymers; partial discharge measurement; polymer films; polymer foams; resins; AC voltage stress; binder; breakdown strength; coated polymer microsphere; electrical property; epoxy resin; filled polymer; hollow spherical particle; insulation material; lifetime model; partial discharge measurement; polymer matrix; reliability; size 30 mum to 100 mum; stability; syntactic foam parameter; Insulation; Materials; Partial discharges; Silicon compounds; Stress; Syntactics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2012 Annual Report Conference on
Conference_Location :
Montreal, QC
ISSN :
0084-9162
Print_ISBN :
978-1-4673-1253-0
Electronic_ISBN :
0084-9162
Type :
conf
DOI :
10.1109/CEIDP.2012.6378804
Filename :
6378804
Link To Document :
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