Title :
Amplitude Distribution Determination by an X-Ray Diffraction Technique
Author :
Wagner, C.E. ; Young, R.A.
Keywords :
Capacitive sensors; Displacement measurement; Distortion measurement; Lattices; Optical films; Optical reflection; Resonant frequency; Strain measurement; Voltage; X-ray diffraction;
Conference_Titel :
21st Annual Symposium on Frequency Control. 1967
DOI :
10.1109/FREQ.1967.199660
