DocumentCode
2484227
Title
Amplitude Distribution Determination by an X-Ray Diffraction Technique
Author
Wagner, C.E. ; Young, R.A.
fYear
1967
fDate
1967
Firstpage
72
Lastpage
82
Keywords
Capacitive sensors; Displacement measurement; Distortion measurement; Lattices; Optical films; Optical reflection; Resonant frequency; Strain measurement; Voltage; X-ray diffraction;
fLanguage
English
Publisher
ieee
Conference_Titel
21st Annual Symposium on Frequency Control. 1967
Type
conf
DOI
10.1109/FREQ.1967.199660
Filename
1536600
Link To Document